Scanning Electron Microscopy and X-ray Microanalysis
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.
ক্যাটাগোরিগুলো:
সাল:
2003
সংস্করণ:
3rd
প্রকাশক:
Springer
ভাষা:
english
পৃষ্ঠা:
361
ISBN 10:
0306472929
ফাইল:
PDF, 166.14 MB
IPFS:
,
english, 2003
কপিরাইট ধারকের অভিযোগের কারণে এই বইটির ডাউনলোড অনুপলব্ধ
Beware of he who would deny you access to information, for in his heart he dreams himself your master
File converter
অনুসন্ধানের আরো ফলাফল
More benefits 
প্রায়শই ব্যবহৃত পরিভাষা
সম্পর্কিত বইয়ের তালিকা
